Prof Hongzhou Zhang

Email:           hongzhou.zhang AT tcd.ie

Telephone: +353.1.8964655

Prof Zhang’s research group is focused on the development and applications of scanning helium ion microscopy (SHIM) that are promising in sub-nanometre analysis, metrology, machinery, and fabrication. To understand the unique contrast mechanisms provided by helium ions, they are interested in the physics of ion-matter interaction and details of signal generation and detection. Is it possible to achieve atomic resolution, high-sensitive analysis as well as clean milling with Angstrom precision? Their research involves extensive characterisation of a variety of different nanostructures through collaboration with the other PIs and external researchers. Developing advanced electron microscopy and related analytical methodologies is their second research focus, such as, Lorentz microscopy, exit-wave reconstruction, and electron energy loss spectroscopy.

Prof Zhang received a MSc and PhD in physics from Peking University (China) and Rice University (US) in 1996 and 1999, respectively. From 2002 to 2004 he held a post-doctoral position at the National Laboratory of Mesoscopic Physics and Electron Microscopy (Peking University, China). In 2004 he became a research fellow in the Electronic Materials Engineering Department at the Australian National University (Australia). He joined CRANN as a Principal Investigator in 2009 and holds a Stokes Lecturer position in the School of Physics, TCD.